Modeling and analysis of die-to-die vertical coupling in 3-D IC

Sangrok Lee, Gawon Kim, Jaemin Kim, Taigon Song, Junho Lee, Hyungdong Lee, Kunwoo Park, Joungho Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

In this paper, die-to-die vertical coupling between clock tree and spiral inductor in three-dimension (3-D) IC is analyzed, and equivalent circuit model for analysis of vertical coupling mechanism is proposed. Analysis and modeling are verified by measurement results of a designed and fabricated test vehicle. The test vehicle has two stacked dies with clock tree or a spiral inductor.

Original languageEnglish
Title of host publicationEPTC 2009 - Proceedings of 2009 11th Electronic Packaging Technology Conference
Pages707-711
Number of pages5
DOIs
StatePublished - 2009
Event2009 11th Electronic Packaging Technology Conference, EPTC 2009 - Singapore, Singapore
Duration: 9 Dec 200911 Dec 2009

Publication series

NameProceedings of the Electronic Packaging Technology Conference, EPTC

Conference

Conference2009 11th Electronic Packaging Technology Conference, EPTC 2009
Country/TerritorySingapore
CitySingapore
Period9/12/0911/12/09

Keywords

  • 3-D IC
  • Coupling
  • Die to die
  • Die-to-die
  • Modeling
  • S-parameter
  • SiP
  • Spiral inductor
  • Stacking
  • Through-silicon-via (TSV)
  • Vertical
  • Wire bonding

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