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Morphological blob-mura defect detection method for TFT-LCD panel inspection

  • Kyungpook National University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

15 Scopus citations

Abstract

The current paper proposes a blob-Mura defect detection method for TFT-LCD panel inspection. A new constraint function that can grow and shrink is defined. Specially, a morphology-based preprocessing method is proposed to improve the detecting capacity of a blob- Mura-defect-detecting algorithm, whereby a test image with blob-Mura defects is expanded to facilitate the defect detection. Plus, in the case of defects with a diameter over 49 pixels, which are hard to detect due to the non-uniformity of their interior, the proposed method changes the image size instead of the constraint function size. The proposed method enables superior defect detection and the use of a simple detecting algorithm.

Original languageEnglish
Title of host publicationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
EditorsMircea Gh. Negoita, Robert J. Howlett, Lakhmi C. Jain
PublisherSpringer Verlag
Pages862-868
Number of pages7
ISBN (Print)9783540232056
DOIs
StatePublished - 2004
Event8th International Conference on Knowledge-Based Intelligent Information and Engineering Systems, KES 2004 - Wellington, New Zealand
Duration: 20 Sep 200425 Sep 2004

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume3215
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference8th International Conference on Knowledge-Based Intelligent Information and Engineering Systems, KES 2004
Country/TerritoryNew Zealand
CityWellington
Period20/09/0425/09/04

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