Abstract
A new automated inspection algorithm is proposed for detecting blob-Mura defects based on multiscale in a thin film transistor liquid crystal display (TFT-LCD) panel. As such, new kernels with different sizes are defined and then used to detect blob-Mura defects with varying sizes and brightness levels. To extract a seed point, an adaptive multilevel-threshold method is employed. Initially, smaller kernels are used to detect smaller defects, then gradually larger kernels are applied to detect larger defects. Through simulation it was verified that the proposed algorithm has a superior capability for detecting blob-Mura defects.
| Original language | English |
|---|---|
| Pages (from-to) | 5465-5468 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 43 |
| Issue number | 8 A |
| DOIs | |
| State | Published - Aug 2004 |
Keywords
- Adaptive multilevel-threshold
- Blob-Mura defect detection
- Multiscale
- TFT-LCD panel