Multiscale metrology and optimization of ultra-scaled InAs quantum well FETs
- Neerav Kharche
- , Gerhard Klimeck
- , Dae Hyun Kim
- , Jess A. Del Alamo
- , Mathieu Luisier
- Rensselaer Polytechnic Institute
- Purdue University
- Massachusetts Institute of Technology
Research output: Contribution to journal › Article › peer-review
15
Scopus
citations