Nondestructive defect inspection for LCDs using optical coherence tomography

Su Hwan Kim; Jee Hyun Kim; Shin Won Kang

doi:10.1016/j.displa.2011.04.002

Nondestructive defect inspection for LCDs using optical coherence tomography

Su Hwan Kim
, Jee Hyun Kim
, Shin Won Kang

School of Electronics Engineering

Kyungpook National University
College of IT Engineering

Research output: Contribution to journal › Article › peer-review

62 Scopus citations

Abstract

In this study, we used optical coherence tomography (OCT) to perform nondestructive inspection of liquid crystal display (LCD) for defects. By using OCT, we obtain tomograms and two-dimensional images of LCD panels. Based on these images, we construct three-dimensional images of the LCD panel and confirm the three-dimensional shape and vertical location of eventual defects with in the LCD panel. This nondestructive and effective defect-inspection method for LCD using OCT that gives direct results and is applicable for detecting defects in flat panel or flexible displays.

Original language	English
Pages (from-to)	325-329
Number of pages	5
Journal	Displays
Volume	32
Issue number	5
DOIs	https://doi.org/10.1016/j.displa.2011.04.002
State	Published - Dec 2011

Keywords

Defect inspection
Nondestructive inspection
Optical coherence tomography
TFT-LCD

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10.1016/j.displa.2011.04.002

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@article{1abd4bf37c974fefa5062525710ea959,

title = "Nondestructive defect inspection for LCDs using optical coherence tomography",

abstract = "In this study, we used optical coherence tomography (OCT) to perform nondestructive inspection of liquid crystal display (LCD) for defects. By using OCT, we obtain tomograms and two-dimensional images of LCD panels. Based on these images, we construct three-dimensional images of the LCD panel and confirm the three-dimensional shape and vertical location of eventual defects with in the LCD panel. This nondestructive and effective defect-inspection method for LCD using OCT that gives direct results and is applicable for detecting defects in flat panel or flexible displays.",

keywords = "Defect inspection, Nondestructive inspection, Optical coherence tomography, TFT-LCD",

author = "Kim, \{Su Hwan\} and Kim, \{Jee Hyun\} and Kang, \{Shin Won\}",

year = "2011",

month = dec,

doi = "10.1016/j.displa.2011.04.002",

language = "English",

volume = "32",

pages = "325--329",

journal = "Displays",

issn = "0141-9382",

publisher = "Elsevier B.V.",

number = "5",

}

TY - JOUR

T1 - Nondestructive defect inspection for LCDs using optical coherence tomography

AU - Kim, Su Hwan

AU - Kim, Jee Hyun

AU - Kang, Shin Won

PY - 2011/12

Y1 - 2011/12

N2 - In this study, we used optical coherence tomography (OCT) to perform nondestructive inspection of liquid crystal display (LCD) for defects. By using OCT, we obtain tomograms and two-dimensional images of LCD panels. Based on these images, we construct three-dimensional images of the LCD panel and confirm the three-dimensional shape and vertical location of eventual defects with in the LCD panel. This nondestructive and effective defect-inspection method for LCD using OCT that gives direct results and is applicable for detecting defects in flat panel or flexible displays.

AB - In this study, we used optical coherence tomography (OCT) to perform nondestructive inspection of liquid crystal display (LCD) for defects. By using OCT, we obtain tomograms and two-dimensional images of LCD panels. Based on these images, we construct three-dimensional images of the LCD panel and confirm the three-dimensional shape and vertical location of eventual defects with in the LCD panel. This nondestructive and effective defect-inspection method for LCD using OCT that gives direct results and is applicable for detecting defects in flat panel or flexible displays.

KW - Defect inspection

KW - Nondestructive inspection

KW - Optical coherence tomography

KW - TFT-LCD

UR - https://www.scopus.com/pages/publications/80255123856

U2 - 10.1016/j.displa.2011.04.002

DO - 10.1016/j.displa.2011.04.002

M3 - Article

AN - SCOPUS:80255123856

SN - 0141-9382

VL - 32

SP - 325

EP - 329

JO - Displays

JF - Displays

IS - 5

ER -

Nondestructive defect inspection for LCDs using optical coherence tomography

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Keywords

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