Novel emission degradation behavior of patterned carbon nanotubes by field emission

Do Hyung Kim, Hee Sun Yang, Hee Dong Kang, Hyeong Rag Lee

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

Field emission behavior of photolithography-based patterned carbon nanotubes (PP-CNTs) was irreversibly degraded, showing a gradual turn-on voltage shift to the high voltage region as a result of field emission measurements. The PP-CNTs show a flat region in Fowler-Nordheim (F-N) plots, which can be attributed to residue-induced emission suppression. The observed degradation in field emission can be attributed to a subsequent degradation of carbon nanotubes emitters by a combination of the high electric-field-induced straightening out effect and the high current induced burning of PP-CNTs. The local emission current and the stability of electron emission were observed in an attempt to investigate the residue effect of the PP-CNTs on the field emission behavior.

Original languageEnglish
Pages (from-to)439-444
Number of pages6
JournalChemical Physics Letters
Volume368
Issue number3-4
DOIs
StatePublished - 17 Jan 2003

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