Abstract
Field emission behavior of photolithography-based patterned carbon nanotubes (PP-CNTs) was irreversibly degraded, showing a gradual turn-on voltage shift to the high voltage region as a result of field emission measurements. The PP-CNTs show a flat region in Fowler-Nordheim (F-N) plots, which can be attributed to residue-induced emission suppression. The observed degradation in field emission can be attributed to a subsequent degradation of carbon nanotubes emitters by a combination of the high electric-field-induced straightening out effect and the high current induced burning of PP-CNTs. The local emission current and the stability of electron emission were observed in an attempt to investigate the residue effect of the PP-CNTs on the field emission behavior.
Original language | English |
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Pages (from-to) | 439-444 |
Number of pages | 6 |
Journal | Chemical Physics Letters |
Volume | 368 |
Issue number | 3-4 |
DOIs | |
State | Published - 17 Jan 2003 |