TY - GEN
T1 - On accurate full-chip extraction and optimization of TSV-to-TSV coupling elements in 3D ICs
AU - Peng, Yarui
AU - Song, Taigon
AU - Petranovic, Dusan
AU - Lim, Sung Kyu
PY - 2013
Y1 - 2013
N2 - In this paper, we present a multiple-TSV based TSV-to-TSV coupling model and extraction methods that consider the impact of depletion region, the silicon substrate effect, and the electrical field distribution around TSVs. Our studies show that these factors have a significant impact on the individual and full-chip scale TSV-to-TSV coupling. Our effort leads to a simplified coupling model that is accurate and efficient on timing, power, and signal integrity in full-chip scale. In order to alleviate the coupling noise in full-chip level 3DIC, we propose grounded guard rings that are more effective than grounded TSV insertion. Results show that our approach reduces coupling noise on TSV nets up to 27.3% with only 7.65% area overhead.
AB - In this paper, we present a multiple-TSV based TSV-to-TSV coupling model and extraction methods that consider the impact of depletion region, the silicon substrate effect, and the electrical field distribution around TSVs. Our studies show that these factors have a significant impact on the individual and full-chip scale TSV-to-TSV coupling. Our effort leads to a simplified coupling model that is accurate and efficient on timing, power, and signal integrity in full-chip scale. In order to alleviate the coupling noise in full-chip level 3DIC, we propose grounded guard rings that are more effective than grounded TSV insertion. Results show that our approach reduces coupling noise on TSV nets up to 27.3% with only 7.65% area overhead.
UR - http://www.scopus.com/inward/record.url?scp=84893399450&partnerID=8YFLogxK
U2 - 10.1109/ICCAD.2013.6691133
DO - 10.1109/ICCAD.2013.6691133
M3 - Conference contribution
AN - SCOPUS:84893399450
SN - 9781479910717
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 281
EP - 288
BT - 2013 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013 - Digest of Technical Papers
T2 - 2013 32nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013
Y2 - 18 November 2013 through 21 November 2013
ER -