On accurate full-chip extraction and optimization of TSV-to-TSV coupling elements in 3D ICs

Yarui Peng, Taigon Song, Dusan Petranovic, Sung Kyu Lim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

18 Scopus citations

Abstract

In this paper, we present a multiple-TSV based TSV-to-TSV coupling model and extraction methods that consider the impact of depletion region, the silicon substrate effect, and the electrical field distribution around TSVs. Our studies show that these factors have a significant impact on the individual and full-chip scale TSV-to-TSV coupling. Our effort leads to a simplified coupling model that is accurate and efficient on timing, power, and signal integrity in full-chip scale. In order to alleviate the coupling noise in full-chip level 3DIC, we propose grounded guard rings that are more effective than grounded TSV insertion. Results show that our approach reduces coupling noise on TSV nets up to 27.3% with only 7.65% area overhead.

Original languageEnglish
Title of host publication2013 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013 - Digest of Technical Papers
Pages281-288
Number of pages8
DOIs
StatePublished - 2013
Event2013 32nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013 - San Jose, CA, United States
Duration: 18 Nov 201321 Nov 2013

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference2013 32nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013
Country/TerritoryUnited States
CitySan Jose, CA
Period18/11/1321/11/13

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