On-axis phase-shifting profilometry with two spatial frequencies using concentric-circular patterns

Eun Hee Kim, Joonku Hahn, Byoungho Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

On-axis phase-shifting profilometry with two spatial frequencies is proposed. The carrier frequency results from the difference in positions of camera and projector on common axis. We use concentric-circular patterns to extract the depth of objects.

Original languageEnglish
Title of host publicationDigital Holography and Three-Dimensional Imaging, DH 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528711
DOIs
StatePublished - 2009
EventDigital Holography and Three-Dimensional Imaging, DH 2009 - Vancouver, Canada
Duration: 26 Apr 200930 Apr 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceDigital Holography and Three-Dimensional Imaging, DH 2009
Country/TerritoryCanada
CityVancouver
Period26/04/0930/04/09

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