TY - GEN
T1 - On-chip glitch-free backup clock changer with noise canceller and edge detector for safety MCU clock system
AU - An, Joonghyun
AU - Cho, Jeonghun
AU - Park, Daejin
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/2/3
Y1 - 2016/2/3
N2 - The embedded microcontroller is operated by the logic gates synchronized on the clock pulses. Severe electrical situations such as high voltage/frequency surge may cause malfunctioning of the clock source. Due to the broken clock, the clockless status of the system may enter into an abnormal state in driving several dangerous output. The glitch-clock pulse by abnormal clock generation causes the inversion of flip-flops status. In this paper, we propose an on-chip clock controller architecture to detect automatically clock failure and to switch the safe backup clock. The implemented edge detector (ED) unit identifies the abnormal low-frequency status of the clock source. The noise canceller (NC) using delay chain circuit of the clock pulse can detect the glitch status of the system clock. The simulation results show that the clock source damaged by external disturbance is successfully restored into safe clock status by the proposed on-chip glitch-free backup clock changer.
AB - The embedded microcontroller is operated by the logic gates synchronized on the clock pulses. Severe electrical situations such as high voltage/frequency surge may cause malfunctioning of the clock source. Due to the broken clock, the clockless status of the system may enter into an abnormal state in driving several dangerous output. The glitch-clock pulse by abnormal clock generation causes the inversion of flip-flops status. In this paper, we propose an on-chip clock controller architecture to detect automatically clock failure and to switch the safe backup clock. The implemented edge detector (ED) unit identifies the abnormal low-frequency status of the clock source. The noise canceller (NC) using delay chain circuit of the clock pulse can detect the glitch status of the system clock. The simulation results show that the clock source damaged by external disturbance is successfully restored into safe clock status by the proposed on-chip glitch-free backup clock changer.
UR - http://www.scopus.com/inward/record.url?scp=84964931539&partnerID=8YFLogxK
U2 - 10.1109/GCCE.2015.7398600
DO - 10.1109/GCCE.2015.7398600
M3 - Conference contribution
AN - SCOPUS:84964931539
T3 - 2015 IEEE 4th Global Conference on Consumer Electronics, GCCE 2015
SP - 487
EP - 488
BT - 2015 IEEE 4th Global Conference on Consumer Electronics, GCCE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th IEEE Global Conference on Consumer Electronics, GCCE 2015
Y2 - 27 October 2015 through 30 October 2015
ER -