On-chip glitch-free backup clock changer with noise canceller and edge detector for safety MCU clock system

Joonghyun An, Jeonghun Cho, Daejin Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The embedded microcontroller is operated by the logic gates synchronized on the clock pulses. Severe electrical situations such as high voltage/frequency surge may cause malfunctioning of the clock source. Due to the broken clock, the clockless status of the system may enter into an abnormal state in driving several dangerous output. The glitch-clock pulse by abnormal clock generation causes the inversion of flip-flops status. In this paper, we propose an on-chip clock controller architecture to detect automatically clock failure and to switch the safe backup clock. The implemented edge detector (ED) unit identifies the abnormal low-frequency status of the clock source. The noise canceller (NC) using delay chain circuit of the clock pulse can detect the glitch status of the system clock. The simulation results show that the clock source damaged by external disturbance is successfully restored into safe clock status by the proposed on-chip glitch-free backup clock changer.

Original languageEnglish
Title of host publication2015 IEEE 4th Global Conference on Consumer Electronics, GCCE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages487-488
Number of pages2
ISBN (Electronic)9781479987511
DOIs
StatePublished - 3 Feb 2016
Event4th IEEE Global Conference on Consumer Electronics, GCCE 2015 - Osaka, Japan
Duration: 27 Oct 201530 Oct 2015

Publication series

Name2015 IEEE 4th Global Conference on Consumer Electronics, GCCE 2015

Conference

Conference4th IEEE Global Conference on Consumer Electronics, GCCE 2015
Country/TerritoryJapan
CityOsaka
Period27/10/1530/10/15

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