On the efficiency of test suite based program repair a systematic assessment of 16 automated repair systems for java programs

Kui Liu, Shangwen Wang, Anil Koyuncu, Kisub Kim, Tegawende F. Bissyande, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, Yves Le Traon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

101 Scopus citations

Abstract

Test-based automated program repair has been a prolific field of research in software engineering in the last decade. Many approaches have indeed been proposed, which leverage test suites as aweak, but affordable, approximation to program specifications. Although the literature regularly sets new records on the number of benchmark bugs that can be fixed, several studies increasingly raise concerns about the limitations and biases of state-of-the-art approaches. For example, the correctness of generated patches has been questioned in a number of studies, while other researchers pointed out that evaluation schemes may be misleading with respect to the processing of fault localization results. Nevertheless, there is little work addressing the efficiency of patch generation, with regard to the practicality of program repair. In this paper, we fill this gap in the literature, by providing an extensive review on the efficiency of test suite based program repair. Our objective is to assess the number of generated patch candidates, since this information is correlated to (1) the strategy to traverse the search space efficiently in order to select sensical repair attempts, (2) the strategy to minimize the test effort for identifying a plausible patch, (3) as well as the strategy to prioritize the generation of a correct patch.

Original languageEnglish
Title of host publicationProceedings - 2020 ACM/IEEE 42nd International Conference on Software Engineering, ICSE 2020
PublisherIEEE Computer Society
Pages615-627
Number of pages13
ISBN (Electronic)9781450371216
DOIs
StatePublished - 27 Jun 2020
Event42nd ACM/IEEE International Conference on Software Engineering, ICSE 2020 - Virtual, Online, Korea, Republic of
Duration: 27 Jun 202019 Jul 2020

Publication series

NameProceedings - International Conference on Software Engineering
ISSN (Print)0270-5257

Conference

Conference42nd ACM/IEEE International Conference on Software Engineering, ICSE 2020
Country/TerritoryKorea, Republic of
CityVirtual, Online
Period27/06/2019/07/20

Keywords

  • Efficiency
  • Empirical assessment.
  • Patch generation
  • Program repair

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