TY - GEN
T1 - On the efficiency of test suite based program repair a systematic assessment of 16 automated repair systems for java programs
AU - Liu, Kui
AU - Wang, Shangwen
AU - Koyuncu, Anil
AU - Kim, Kisub
AU - Bissyande, Tegawende F.
AU - Kim, Dongsun
AU - Wu, Peng
AU - Klein, Jacques
AU - Mao, Xiaoguang
AU - Traon, Yves Le
N1 - Publisher Copyright:
© 2020 Association for Computing Machinery.
PY - 2020/6/27
Y1 - 2020/6/27
N2 - Test-based automated program repair has been a prolific field of research in software engineering in the last decade. Many approaches have indeed been proposed, which leverage test suites as aweak, but affordable, approximation to program specifications. Although the literature regularly sets new records on the number of benchmark bugs that can be fixed, several studies increasingly raise concerns about the limitations and biases of state-of-the-art approaches. For example, the correctness of generated patches has been questioned in a number of studies, while other researchers pointed out that evaluation schemes may be misleading with respect to the processing of fault localization results. Nevertheless, there is little work addressing the efficiency of patch generation, with regard to the practicality of program repair. In this paper, we fill this gap in the literature, by providing an extensive review on the efficiency of test suite based program repair. Our objective is to assess the number of generated patch candidates, since this information is correlated to (1) the strategy to traverse the search space efficiently in order to select sensical repair attempts, (2) the strategy to minimize the test effort for identifying a plausible patch, (3) as well as the strategy to prioritize the generation of a correct patch.
AB - Test-based automated program repair has been a prolific field of research in software engineering in the last decade. Many approaches have indeed been proposed, which leverage test suites as aweak, but affordable, approximation to program specifications. Although the literature regularly sets new records on the number of benchmark bugs that can be fixed, several studies increasingly raise concerns about the limitations and biases of state-of-the-art approaches. For example, the correctness of generated patches has been questioned in a number of studies, while other researchers pointed out that evaluation schemes may be misleading with respect to the processing of fault localization results. Nevertheless, there is little work addressing the efficiency of patch generation, with regard to the practicality of program repair. In this paper, we fill this gap in the literature, by providing an extensive review on the efficiency of test suite based program repair. Our objective is to assess the number of generated patch candidates, since this information is correlated to (1) the strategy to traverse the search space efficiently in order to select sensical repair attempts, (2) the strategy to minimize the test effort for identifying a plausible patch, (3) as well as the strategy to prioritize the generation of a correct patch.
KW - Efficiency
KW - Empirical assessment.
KW - Patch generation
KW - Program repair
UR - http://www.scopus.com/inward/record.url?scp=85090848241&partnerID=8YFLogxK
U2 - 10.1145/3377811.3380338
DO - 10.1145/3377811.3380338
M3 - Conference contribution
AN - SCOPUS:85090848241
T3 - Proceedings - International Conference on Software Engineering
SP - 615
EP - 627
BT - Proceedings - 2020 ACM/IEEE 42nd International Conference on Software Engineering, ICSE 2020
PB - IEEE Computer Society
T2 - 42nd ACM/IEEE International Conference on Software Engineering, ICSE 2020
Y2 - 27 June 2020 through 19 July 2020
ER -