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On the universality of drain-induced-barrier-lowering in field-effect transistors
Su Min Choi, Hyeon Bhin Jo, Do Young Yun, Jun Gyu Kim, Wan Soo Park, Ji Min Baek, In Geun Lee, Jang Kyoo Shin, Hyuk Min Kwon, Takuya Tsutsumi, Hiroki Sugiyama, Hideaki Matsuzaki, Jae Hak Lee, Dae Hyun Kim
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations