Abstract
For the high-density memory application of resistive random access memory (ReRAM), we study the complementary resistive switch (CRS) behavior of a HfO x-based ReRAM with a TiO x-based ReRAM. To control the operation voltages of the CRS device, we used ReRAMs having asymmetric set and reset voltages. Consequently, we achieved a wider voltage window for the read process, high switch speed, high reliability, and more than ten times readout margin from the heterodevice CRS.
| Original language | English |
|---|---|
| Article number | 6165638 |
| Pages (from-to) | 600-602 |
| Number of pages | 3 |
| Journal | IEEE Electron Device Letters |
| Volume | 33 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2012 |
Keywords
- Complementary resistive switches (CRSs)
- cross-point array
- nonvolatile memory
- resistive memory
- RRAM
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