Oxide thin film transistors on novel flexible substrates

S. J. Pearton, Wantae Lim, Erica Douglas, Fan Ren, Young Woo Heo, D. P. Norton

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Enhancement-mode TFTs based on amorphous InGaZnO channel were fabricated on paper, glass or plastic substrates at low temperature (< 100°C). The TFTs operated in enhancement mode and showed low operating voltages of 0.5-2.5 V, drain current on-to-off ratios of ∼ 105, sub-threshold gate-voltage swing of 0.25-0.5 V.decade-1, and high saturation mobilities of 5-12 cm2.V-1.s-1. The devices exhibited small shifts during 1000 hours aging time at room temperature. Significant challenges remain, including improving the stability of the devices under bias, lowering the operating voltages, replacing metal contacts with conducting polymers that should be more resistant to cracking on rolling-up of flexible substrates and developing large-area printing processes that are compatible with manufacturing these devices on very large areas.

Original languageEnglish
Title of host publicationOxide-based Materials and Devices
DOIs
StatePublished - 2010
EventOxide-based Materials and Devices - San Francisco, CA, United States
Duration: 24 Jan 201027 Jan 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7603
ISSN (Print)0277-786X

Conference

ConferenceOxide-based Materials and Devices
Country/TerritoryUnited States
CitySan Francisco, CA
Period24/01/1027/01/10

Keywords

  • Encapsulation
  • Flexible substrates
  • Indium gallium zinc oxide
  • Thin film transistors

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