P-96: Analysis of address discharge delay characteristics using transient characteristics of IR emission intensity in plasma display panel

Hyung Dal Park; Jae Hyun Kim; Heung Sik Tae; Deok Myeong Kim; Jeong Hyun Seo

doi:10.1889/1.3621130

P-96: Analysis of address discharge delay characteristics using transient characteristics of IR emission intensity in plasma display panel

Hyung Dal Park, Jae Hyun Kim, Heung Sik Tae, Deok Myeong Kim, Jeong Hyun Seo

School of Electronics Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp-falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.

Original language	English
Pages (from-to)	1468-1470
Number of pages	3
Journal	Digest of Technical Papers - SID International Symposium
Volume	42 1
DOIs	https://doi.org/10.1889/1.3621130
State	Published - Jun 2011

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title = "P-96: Analysis of address discharge delay characteristics using transient characteristics of IR emission intensity in plasma display panel",

abstract = "This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp-falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.",

author = "Park, {Hyung Dal} and Kim, {Jae Hyun} and Tae, {Heung Sik} and Kim, {Deok Myeong} and Seo, {Jeong Hyun}",

year = "2011",

month = jun,

doi = "10.1889/1.3621130",

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volume = "42 1",

pages = "1468--1470",

journal = "Digest of Technical Papers - SID International Symposium",

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AU - Park, Hyung Dal

AU - Kim, Jae Hyun

AU - Tae, Heung Sik

AU - Kim, Deok Myeong

AU - Seo, Jeong Hyun

PY - 2011/6

Y1 - 2011/6

N2 - This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp-falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.

AB - This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp-falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.

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M3 - Article

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JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

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P-96: Analysis of address discharge delay characteristics using transient characteristics of IR emission intensity in plasma display panel

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