Pb cation induced low-temperature crystallization of (Ba•Pb) hexa-ferrite thin films

Seok Joo Doh, Jung Ho Je, Tae Sik Cho

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3 Scopus citations

Abstract

We have studied the low-temperature crystallization of (Ba•Pb) hexa-ferrite thin films using real time synchrotron X-ray scattering, anomalous X-ray scattering, and vibrating sample magnetometer. The crystallization temperature of amorphous (Ba•Pb) hexa-ferrite film (300-Å-thick, ∼530°C) was much lower than that of amorphous Ba hexa-ferrite film, ∼750°C. The crystalline (Ba•Pb) hexa-ferrite phase was formed by solid phase transformation of the interfacial crystalline Fe3O 4 phase through the diffusion of Ba or Pb cations. The low crystallization temperature of the (Ba•Pb) hexa-ferrite phase was due to the lower diffusion activation barrier of Pb cations than that of Ba cations. The small grain size (∼40 nm in diamter) and comparable magnetic properties (Ms : 337 emu/cm3, iHc : 1.60 kOe) of the crystallized (Ba•Pb) hexa-ferrite film also demonstrate its potential possibility for high-density recording media.

Original languageEnglish
Pages (from-to)365-368
Number of pages4
JournalJournal of Electroceramics
Volume17
Issue number2-4
DOIs
StatePublished - Dec 2006

Keywords

  • Crystallization
  • Hexa-ferrite
  • Low temperature
  • Pb ions
  • Synchrotron X-ray

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