Abstract
We have studied the low-temperature crystallization of (Ba•Pb) hexa-ferrite thin films using real time synchrotron X-ray scattering, anomalous X-ray scattering, and vibrating sample magnetometer. The crystallization temperature of amorphous (Ba•Pb) hexa-ferrite film (300-Å-thick, ∼530°C) was much lower than that of amorphous Ba hexa-ferrite film, ∼750°C. The crystalline (Ba•Pb) hexa-ferrite phase was formed by solid phase transformation of the interfacial crystalline Fe3O 4 phase through the diffusion of Ba or Pb cations. The low crystallization temperature of the (Ba•Pb) hexa-ferrite phase was due to the lower diffusion activation barrier of Pb cations than that of Ba cations. The small grain size (∼40 nm in diamter) and comparable magnetic properties (Ms : 337 emu/cm3, iHc : 1.60 kOe) of the crystallized (Ba•Pb) hexa-ferrite film also demonstrate its potential possibility for high-density recording media.
Original language | English |
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Pages (from-to) | 365-368 |
Number of pages | 4 |
Journal | Journal of Electroceramics |
Volume | 17 |
Issue number | 2-4 |
DOIs | |
State | Published - Dec 2006 |
Keywords
- Crystallization
- Hexa-ferrite
- Low temperature
- Pb ions
- Synchrotron X-ray