Abstract
A study of 100 keV Co+-implanted C60 films with Rutherford Backscattering and Raman spectroscopy has revealed the pronounced cobalt translation from the surface layer of amorphous carbon into the deeper crystalline fullerene due to post-implantation annealing at 300 °C. Carbon density gradient along the film depth is discussed as a driving force of this effect. Cobalt deficit in the doped fullerene layer, detected by means of ion beam analysis, suggests ionization of the C60 molecules under the collisions with 2 MeV He+ ions.
Original language | English |
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Pages (from-to) | 366-370 |
Number of pages | 5 |
Journal | Chemical Physics Letters |
Volume | 423 |
Issue number | 4-6 |
DOIs | |
State | Published - 1 Jun 2006 |