Abstract
A study of 100 keV Co+-implanted C60 films with Rutherford Backscattering and Raman spectroscopy has revealed the pronounced cobalt translation from the surface layer of amorphous carbon into the deeper crystalline fullerene due to post-implantation annealing at 300 °C. Carbon density gradient along the film depth is discussed as a driving force of this effect. Cobalt deficit in the doped fullerene layer, detected by means of ion beam analysis, suggests ionization of the C60 molecules under the collisions with 2 MeV He+ ions.
| Original language | English |
|---|---|
| Pages (from-to) | 366-370 |
| Number of pages | 5 |
| Journal | Chemical Physics Letters |
| Volume | 423 |
| Issue number | 4-6 |
| DOIs | |
| State | Published - 1 Jun 2006 |