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Planar doping of crystalline fullerene with cobalt

  • Vasily Lavrentiev
  • , Hiroshi Naramoto
  • , Kazumasa Narumi
  • , Seiji Sakai
  • , Pavel Avramov
  • Japan Atomic Energy Agency
  • INTERCI

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

A study of 100 keV Co+-implanted C60 films with Rutherford Backscattering and Raman spectroscopy has revealed the pronounced cobalt translation from the surface layer of amorphous carbon into the deeper crystalline fullerene due to post-implantation annealing at 300 °C. Carbon density gradient along the film depth is discussed as a driving force of this effect. Cobalt deficit in the doped fullerene layer, detected by means of ion beam analysis, suggests ionization of the C60 molecules under the collisions with 2 MeV He+ ions.

Original languageEnglish
Pages (from-to)366-370
Number of pages5
JournalChemical Physics Letters
Volume423
Issue number4-6
DOIs
StatePublished - 1 Jun 2006

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