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Practical application of diffusion pathway analysis for SiC-metal reactions

  • J. S. Park
  • , J. Cho
  • , S. Yi
  • , J. H. Perepezko
  • Yonsei University
  • Korea Institute of Industrial Technology
  • University of Wisconsin-Madison

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Diffusion pathway analyses and operation kinetics for SiC-/metal interface reaction have been investigated. To select the materials for an interlayer between an SiC and Ni reaction couple, a constructed chemical potential diagram has been utilized. When Cr was selected as the interlayer material for the SiC/Ni diffusion couple, the reaction pathway and product phase morphology have been modified by controlling the component flux. The strategy of modifying the diffusion pathway provides insight for achieving a stable interface design and for controlling the interface morphology within a kinetic bound.

Original languageEnglish
Pages (from-to)231-238
Number of pages8
JournalMetals and Materials International
Volume12
Issue number3
DOIs
StatePublished - Jun 2006

Keywords

  • Diffusion pathway
  • Interface design
  • Interface reactions

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