Prevention of boundary image sticking in an AC plasma display panel using a vacuum sealing process

Choon Sang Park; Heung Sik Tae; Young Kuk Kwon; Eun G. Heo; Byung Hak Lee

doi:10.1109/TED.2008.921986

Prevention of boundary image sticking in an AC plasma display panel using a vacuum sealing process

Choon Sang Park, Heung Sik Tae, Young Kuk Kwon, Eun G. Heo, Byung Hak Lee

School of Electronics Engineering

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Boundary image sticking can be inherently prevented in an ac plasma display panel fabricated using a vacuum sealing process. The results indicate that residual impurities, such as nitrogen or oxygen, are essentially related to the production of boundary image sticking. When checking the production of boundary image sticking in a test panel fabricated using a N₂ or an O₂ flow during the vacuum sealing process, no boundary image sticking appeared in the case of a N₂ flow, whereas boundary image sticking was produced with an O₂ flow, although the test panel was fabricated using a vacuum sealing process. Consequently, reducing the residual impurity, particularly oxygen, based on a vacuum sealing process can inherently prevent boundary image sticking.

Original language	English
Pages (from-to)	1345-1351
Number of pages	7
Journal	IEEE Transactions on Electron Devices
Volume	55
Issue number	6
DOIs	https://doi.org/10.1109/TED.2008.921986
State	Published - Jun 2008

Keywords

42-in ac plasma display panel (ac-PDP) module
Atmospheric pressure sealing process
Boundary image sticking
Focused ion beam (FIB)
impurity gas
MgO hardness
MgO sputtering rate
Nanoindentor
O or N flow
Scanning electron microscope (SEM)
Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Vacuum sealing process

Access to Document

10.1109/TED.2008.921986

Cite this

@article{09a677560c57456a8e97d62f0d339bcb,

title = "Prevention of boundary image sticking in an AC plasma display panel using a vacuum sealing process",

abstract = "Boundary image sticking can be inherently prevented in an ac plasma display panel fabricated using a vacuum sealing process. The results indicate that residual impurities, such as nitrogen or oxygen, are essentially related to the production of boundary image sticking. When checking the production of boundary image sticking in a test panel fabricated using a N2 or an O2 flow during the vacuum sealing process, no boundary image sticking appeared in the case of a N2 flow, whereas boundary image sticking was produced with an O2 flow, although the test panel was fabricated using a vacuum sealing process. Consequently, reducing the residual impurity, particularly oxygen, based on a vacuum sealing process can inherently prevent boundary image sticking.",

keywords = "42-in ac plasma display panel (ac-PDP) module, Atmospheric pressure sealing process, Boundary image sticking, Focused ion beam (FIB), impurity gas, MgO hardness, MgO sputtering rate, Nanoindentor, O or N flow, Scanning electron microscope (SEM), Time-of-flight secondary ion mass spectrometry (TOF-SIMS), Vacuum sealing process",

author = "Park, {Choon Sang} and Tae, {Heung Sik} and Kwon, {Young Kuk} and Heo, {Eun G.} and Lee, {Byung Hak}",

year = "2008",

month = jun,

doi = "10.1109/TED.2008.921986",

language = "English",

volume = "55",

pages = "1345--1351",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "6",

}

TY - JOUR

T1 - Prevention of boundary image sticking in an AC plasma display panel using a vacuum sealing process

AU - Park, Choon Sang

AU - Tae, Heung Sik

AU - Kwon, Young Kuk

AU - Heo, Eun G.

AU - Lee, Byung Hak

PY - 2008/6

Y1 - 2008/6

N2 - Boundary image sticking can be inherently prevented in an ac plasma display panel fabricated using a vacuum sealing process. The results indicate that residual impurities, such as nitrogen or oxygen, are essentially related to the production of boundary image sticking. When checking the production of boundary image sticking in a test panel fabricated using a N2 or an O2 flow during the vacuum sealing process, no boundary image sticking appeared in the case of a N2 flow, whereas boundary image sticking was produced with an O2 flow, although the test panel was fabricated using a vacuum sealing process. Consequently, reducing the residual impurity, particularly oxygen, based on a vacuum sealing process can inherently prevent boundary image sticking.

AB - Boundary image sticking can be inherently prevented in an ac plasma display panel fabricated using a vacuum sealing process. The results indicate that residual impurities, such as nitrogen or oxygen, are essentially related to the production of boundary image sticking. When checking the production of boundary image sticking in a test panel fabricated using a N2 or an O2 flow during the vacuum sealing process, no boundary image sticking appeared in the case of a N2 flow, whereas boundary image sticking was produced with an O2 flow, although the test panel was fabricated using a vacuum sealing process. Consequently, reducing the residual impurity, particularly oxygen, based on a vacuum sealing process can inherently prevent boundary image sticking.

KW - 42-in ac plasma display panel (ac-PDP) module

KW - Atmospheric pressure sealing process

KW - Boundary image sticking

KW - Focused ion beam (FIB)

KW - impurity gas

KW - MgO hardness

KW - MgO sputtering rate

KW - Nanoindentor

KW - O or N flow

KW - Scanning electron microscope (SEM)

KW - Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

KW - Vacuum sealing process

UR - http://www.scopus.com/inward/record.url?scp=44949178586&partnerID=8YFLogxK

U2 - 10.1109/TED.2008.921986

DO - 10.1109/TED.2008.921986

M3 - Article

AN - SCOPUS:44949178586

SN - 0018-9383

VL - 55

SP - 1345

EP - 1351

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 6

ER -

Prevention of boundary image sticking in an AC plasma display panel using a vacuum sealing process

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this