@inproceedings{e77b8c048f4c4e4b9473c94c0af929e9,
title = "Random Telegraph Noise in 130 nm n-MOS and p-MOS Transistors",
author = "Youngchang Yoon and Hochul Lee and Kang, {In Man} and Park, {Byung Gook} and Lee, {Jong Duk} and Hyungcheol Shin",
year = "2006",
language = "English",
series = "Device Research Conference - Conference Digest, DRC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "283--284",
booktitle = "64th DRC 2006 - Device Research Conference",
address = "United States",
note = "64th Device Research Conference, DRC 2006 ; Conference date: 26-06-2006 Through 28-06-2006",
}