Random Telegraph Noise in 130 nm n-MOS and p-MOS Transistors

Youngchang Yoon, Hochul Lee, In Man Kang, Byung Gook Park, Jong Duk Lee, Hyungcheol Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations
Original languageEnglish
Title of host publication64th DRC 2006 - Device Research Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages283-284
Number of pages2
ISBN (Electronic)0780397495, 9780780397491
StatePublished - 2006
Event64th Device Research Conference, DRC 2006 - Parker, United States
Duration: 26 Jun 200628 Jun 2006

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Conference

Conference64th Device Research Conference, DRC 2006
Country/TerritoryUnited States
CityParker
Period26/06/0628/06/06

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