Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO2/α-Al2O3(0001) film

G. I.Hong Rue; Joung Young Sug; S. U.Ho Lee; Sook Jeong Ha; Kyung Sook Lee; Jin Gyu Kim; Dae Hwang Yoo; Yoon Hwae Hwang; Hyung Kook Kim

doi:10.1142/s0217979203018715

Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film

G. I.Hong Rue
, Joung Young Sug
, S. U.Ho Lee
, Sook Jeong Ha
, Kyung Sook Lee
, Jin Gyu Kim
, Dae Hwang Yoo
, Yoon Hwae Hwang
, Hyung Kook Kim

Department of Electrical Engineering

Pusan National University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

For the defective semiconductor SnO₂ thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G₁₂(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

Original language	English
Pages (from-to)	1183-1187
Number of pages	5
Journal	International Journal of Modern Physics B
Volume	17
Issue number	8-9 I
DOIs	https://doi.org/10.1142/s0217979203018715
State	Published - 10 Apr 2003

Access to Document

10.1142/s0217979203018715

Cite this

Rue, G. I. H., Sug, J. Y., Lee, S. U. H., Ha, S. J., Lee, K. S., Kim, J. G., Yoo, D. H., Hwang, Y. H., & Kim, H. K. (2003). Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film. International Journal of Modern Physics B, 17(8-9 I), 1183-1187. https://doi.org/10.1142/s0217979203018715

@article{c298fd181fd6471a80127e1948efdcec,

title = "Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO2/α-Al2O3(0001) film",

abstract = "For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 {\AA} implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.",

author = "Rue, \{G. I.Hong\} and Sug, \{Joung Young\} and Lee, \{S. U.Ho\} and Ha, \{Sook Jeong\} and Lee, \{Kyung Sook\} and Kim, \{Jin Gyu\} and Yoo, \{Dae Hwang\} and Hwang, \{Yoon Hwae\} and Kim, \{Hyung Kook\}",

year = "2003",

month = apr,

day = "10",

doi = "10.1142/s0217979203018715",

language = "English",

volume = "17",

pages = "1183--1187",

journal = "International Journal of Modern Physics B",

issn = "0217-9792",

publisher = "World Scientific",

number = "8-9 I",

}

TY - JOUR

T1 - Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO2/α-Al2O3(0001) film

AU - Rue, G. I.Hong

AU - Sug, Joung Young

AU - Lee, S. U.Ho

AU - Ha, Sook Jeong

AU - Lee, Kyung Sook

AU - Kim, Jin Gyu

AU - Yoo, Dae Hwang

AU - Hwang, Yoon Hwae

AU - Kim, Hyung Kook

PY - 2003/4/10

Y1 - 2003/4/10

N2 - For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

AB - For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

UR - https://www.scopus.com/pages/publications/0038778462

U2 - 10.1142/s0217979203018715

DO - 10.1142/s0217979203018715

M3 - Article

AN - SCOPUS:0038778462

SN - 0217-9792

VL - 17

SP - 1183

EP - 1187

JO - International Journal of Modern Physics B

JF - International Journal of Modern Physics B

IS - 8-9 I

ER -

Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film

Abstract

Access to Document

Other files and links

Fingerprint

Cite this