Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO2/α-Al2O3(0001) film

G. I.Hong Rue; Joung Young Sug; S. U.Ho Lee; Sook Jeong Ha; Kyung Sook Lee; Jin Gyu Kim; Dae Hwang Yoo; Yoon Hwae Hwang; Hyung Kook Kim

doi:10.1142/s0217979203018715

Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film

G. I.Hong Rue, Joung Young Sug, S. U.Ho Lee, Sook Jeong Ha, Kyung Sook Lee, Jin Gyu Kim, Dae Hwang Yoo, Yoon Hwae Hwang, Hyung Kook Kim

Department of Electrical Engineering

Pusan National University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

For the defective semiconductor SnO₂ thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G₁₂(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

Original language	English
Pages (from-to)	1183-1187
Number of pages	5
Journal	International Journal of Modern Physics B
Volume	17
Issue number	8-9 I
DOIs	https://doi.org/10.1142/s0217979203018715
State	Published - 10 Apr 2003

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Rue, G. I. H., Sug, J. Y., Lee, S. U. H., Ha, S. J., Lee, K. S., Kim, J. G., Yoo, D. H., Hwang, Y. H., & Kim, H. K. (2003). Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film. International Journal of Modern Physics B, 17(8-9 I), 1183-1187. https://doi.org/10.1142/s0217979203018715

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title = "Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO2/α-Al2O3(0001) film",

abstract = "For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 {\AA} implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.",

author = "Rue, \{G. I.Hong\} and Sug, \{Joung Young\} and Lee, \{S. U.Ho\} and Ha, \{Sook Jeong\} and Lee, \{Kyung Sook\} and Kim, \{Jin Gyu\} and Yoo, \{Dae Hwang\} and Hwang, \{Yoon Hwae\} and Kim, \{Hyung Kook\}",

year = "2003",

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doi = "10.1142/s0217979203018715",

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AU - Rue, G. I.Hong

AU - Sug, Joung Young

AU - Lee, S. U.Ho

AU - Ha, Sook Jeong

AU - Lee, Kyung Sook

AU - Kim, Jin Gyu

AU - Yoo, Dae Hwang

AU - Hwang, Yoon Hwae

AU - Kim, Hyung Kook

PY - 2003/4/10

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N2 - For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

AB - For the defective semiconductor SnO2 thin film epitaxially grown on sapphire, height-height correlation functions are evaluated from x-ray scattering and atomic force microscopy(AFM) by a quick method. The small value √G12(0) ≈ 1.67 Å implies that the interfaces are fairly well correlated. This is consistent with the well-defined oscillation in the longitudinal diffuse scattering intensity.

UR - https://www.scopus.com/pages/publications/0038778462

U2 - 10.1142/s0217979203018715

DO - 10.1142/s0217979203018715

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SN - 0217-9792

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SP - 1183

EP - 1187

JO - International Journal of Modern Physics B

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IS - 8-9 I

ER -

Rapid estimation of the height-height correlation functions from the synchrotron x-ray and AFM study of very thin SnO₂/α-Al₂O₃(0001) film

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