TY - GEN
T1 - Recurrent neural networks with missing information imputation for medical examination data prediction
AU - Kim, Han Gyu
AU - Jang, Gil Jin
AU - Choi, Ho Jin
AU - Kim, Minho
AU - Kim, Young Won
AU - Choi, Jaehun
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/3/17
Y1 - 2017/3/17
N2 - In this work, we use recurrent neural network (RNN) to predict the medical examination data with missing parts. There often exist missing parts in medical examination data due to various human factors, for instance, because human subjects occasionally miss their annual examinations. Such missing parts make it hard to predict the future examination data by machines. Thus, imputation of the missing information is needed for accurate prediction of medical examination data. Among various types of RNNs, we choose simple recurrent network (SRN) and long short-term memory (LSTM) to predict the missing information as well as the future medical examination data, as they show good performance in many relevant applications. In our proposed method, the temporal trajectories of the medical examination measurements are modeled by RNNs with the missed measurements compensated, which is then used to predict the future measurements to be used as diagnosing the diseases of the subjects in advance. We have carried out experiments using a medical examination database of Korean people for 12 consecutive years with 13 medical fields. In this database, 11500 people took the medical check-up every year, and 7400 people missed their examination occasionally. We use complete data to train RNNs, and the data with missing parts are used to evaluate the imputation and future measurement prediction performance. In terms of root mean squared error (RMSE) and source to noise ratio (SNR) between the prediction and the actual measurements, the experimental results show that the proposed RNNs predicts medical examination data much better than the conventional linear regression in most of the examination items.
AB - In this work, we use recurrent neural network (RNN) to predict the medical examination data with missing parts. There often exist missing parts in medical examination data due to various human factors, for instance, because human subjects occasionally miss their annual examinations. Such missing parts make it hard to predict the future examination data by machines. Thus, imputation of the missing information is needed for accurate prediction of medical examination data. Among various types of RNNs, we choose simple recurrent network (SRN) and long short-term memory (LSTM) to predict the missing information as well as the future medical examination data, as they show good performance in many relevant applications. In our proposed method, the temporal trajectories of the medical examination measurements are modeled by RNNs with the missed measurements compensated, which is then used to predict the future measurements to be used as diagnosing the diseases of the subjects in advance. We have carried out experiments using a medical examination database of Korean people for 12 consecutive years with 13 medical fields. In this database, 11500 people took the medical check-up every year, and 7400 people missed their examination occasionally. We use complete data to train RNNs, and the data with missing parts are used to evaluate the imputation and future measurement prediction performance. In terms of root mean squared error (RMSE) and source to noise ratio (SNR) between the prediction and the actual measurements, the experimental results show that the proposed RNNs predicts medical examination data much better than the conventional linear regression in most of the examination items.
KW - long short-term memory
KW - medical examination data prediction
KW - recurrent neural network
UR - http://www.scopus.com/inward/record.url?scp=85017630001&partnerID=8YFLogxK
U2 - 10.1109/BIGCOMP.2017.7881685
DO - 10.1109/BIGCOMP.2017.7881685
M3 - Conference contribution
AN - SCOPUS:85017630001
T3 - 2017 IEEE International Conference on Big Data and Smart Computing, BigComp 2017
SP - 317
EP - 323
BT - 2017 IEEE International Conference on Big Data and Smart Computing, BigComp 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE International Conference on Big Data and Smart Computing, BigComp 2017
Y2 - 13 February 2017 through 16 February 2017
ER -