@inproceedings{26c10127f98d421b8ef79fd63163222f,
title = "Reliability analysis of the SMES system in the team workshop benchmark problem 22 utilizing reliability index approach",
abstract = "This paper presents an effective methodology for reliability analysis of electromagnetic devices taking uncertainties of design parameters into account. To achieve the goal, the reliability index approach based on the first-order reliability method is adopted to deal with probabilistic constraints. The validity and efficiency of the proposed method is tested with the TEAM Workshop Problem 22 compared to Monte Carlo simulation.",
keywords = "Electromagnetic design, Reliability analysis, Robustness",
author = "Kim, {Dong Wook} and Sung, {Young Hwa} and Kim, {Dong Hun}",
year = "2011",
doi = "10.1049/cp.2011.0072",
language = "English",
isbn = "9781849194686",
series = "IET Conference Publications",
number = "577 CP",
pages = "138--139",
booktitle = "IET 8th International Conference on Computation in Electromagnetics, CEM 2011",
edition = "577 CP",
note = "IET 8th International Conference on Computation in Electromagnetics, CEM 2011 ; Conference date: 11-04-2011 Through 14-04-2011",
}