Review: Cantilever-based sensors for high speed atomic force microscopy

Bernard Ouma Alunda, Yong Joong Lee

Research output: Contribution to journalReview articlepeer-review

42 Scopus citations

Abstract

This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio-and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.

Original languageEnglish
Article number4784
Pages (from-to)1-39
Number of pages39
JournalSensors
Volume20
Issue number17
DOIs
StatePublished - 1 Sep 2020

Keywords

  • Atomic force microscope
  • Biosensors
  • High-speed atomic force microscope
  • Microcantilever
  • Ultra-short cantilevers

Fingerprint

Dive into the research topics of 'Review: Cantilever-based sensors for high speed atomic force microscopy'. Together they form a unique fingerprint.

Cite this