Rietveld refinement of highly textured copper sheet using pole density distribution

The Rietveld refinement for the highly textured copper (Cu) sheet, which was prepared by a cold rolling process, was carried out by both the X-ray diffraction data of the normal direction in the sample orientation and the pole figure data of three reflections: (111), (200) and (220). The agreement between calculated and observed patterns was not satisfactory due to the textured effect of the copper sheet. The Rietveld refinement for the copper sheet could be done successfully by applying the pole density of each reflection obtained from the corresponding inverse pole figure to the X-ray diffraction data for the normal direction. The final R-weighted pattern, R_wp, was 12.99% and the goodness-of-fit indicator, S, was 3.68. This approach, based on the pole density distribution of each reflection, may be an alternative technique to do the Rietveld refinement for strongly textured polycrystalline samples where simple or semiempirical functions do not sufficiently describe the textured effect.