Scintillation Properties of Ce³⁺ Doped Silicon-Magnesium-Aluminum-Lithium Glass Scintillators by using Radiation Sources

Glass scintillators can be doped with different elements to improve their luminescence properties. In this study, we present 0.5 wt% Ce³⁺-doped (58−x)SiO₂-4MgO-18Al₂O₃-20Li₂O and (58−x)SiO₂- 4MgO-18Al₂O₃-20LiF glass scintillators. We used a pulsed laser to measure the laser-induced emission spectrum and the decay time with decreasing temperature from 300 K to 10 K. The light intensity of both glass samples increased with decreasing temperature from 300 K to 10 K. Additionally, the two glass samples exhibited a fast decay time of approximately 25 ns. In the photo-induced spectrum, an excitation peak at 312 nm and two emission peaks, at 370 nm and 700 nm, were observed in both the glass samples. The X-ray-induced emission intensity of former is approximately six times higher than that of latter, and only former glass sample exhibits a proton-induced emission spectrum.