Scintillation Properties of Tetrafluoroaluminate Crystal

In this article, single crystals of a new nonhygroscopic scintillating material of tetrafluoroaluminate (TlAlF4) were grown using the Bridgman-Stockbarger technique. The diffraction pattern obtained from powder X-ray diffraction was found to be in good agreement with the reference data. The X-ray-induced luminescence measurements of the grown crystal sample exhibit a very strong intrinsic emission band in the wavelength range from 300 to 450 nm, with a peak maximum at 390 nm. Scintillation properties, such as pulse height spectra and decay time of the grown crystals, were investigated using γ-rays from the 137Cs radiation source. The scintillation light yield was found to be 11 800 ph/MeV. At room temperature, the measured decay time profile was fitted with three exponential functions; the result showed a fast component of 194 ns (13.1%), a medium component of 992 ns (84.6%), and a slow component of 3.5 μs (2.3%). Trap centers were studied using the results obtained from thermally stimulated luminescence. The temperature dependence of the scintillation light yield and decay time was also studied. The results showed that TlAlF4 is a promising scintillator crystal, and thus, a potential candidate for X-ray and γ-ray detection.