Selective annealing effects of asymmetric Schottky-type AiGaN metal-semiconductor-metal UV-B sensor

J. H. Seol, B. J. Park, S. H. Hahm

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We proposed and fabricated AlGaN/GaN-based asymmetric Schottky-type metal-semiconductor-metal (MSM) ultraviolet (UV) photodiode with as-deposited Ti/Al/Ni/Au and Ni/Au as Schottky contact metal schemes. Ti/Al/Ni/Au electrode was annealed locally by using the electrical breakdown of a sacrificial insulator. We investigated the electrical and optical characteristics of devices before and after the local annealing. After the selective annealing, the dark current at -1.7 V bias and the UV to visible rejection ratio (UVRR) at -5 V bias were 2.4×10-12 A/cm2 and 527, which were improved remarkably compared to dark current of 4.05×10-10 A/cm2 and UVRR of 86 before annealing.

Original languageEnglish
Title of host publicationState-of-the-Art Program on Compound Semiconductors, SOTAPOCS 62
EditorsT. Anderson, J. Hite, R. Lynch, C. O'Dwyer, E. Douglas
PublisherElectrochemical Society Inc.
Pages19-23
Number of pages5
Edition6
ISBN (Electronic)9781607688808
ISBN (Print)9781607688808
DOIs
StatePublished - 2019
EventSymposium on State-of-the-Art Program on Compound Semiconductors 62, SOTAPOCS 2019 - 236th ECS Meeting - Atlanta, United States
Duration: 13 Oct 201917 Oct 2019

Publication series

NameECS Transactions
Number6
Volume92
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

ConferenceSymposium on State-of-the-Art Program on Compound Semiconductors 62, SOTAPOCS 2019 - 236th ECS Meeting
Country/TerritoryUnited States
CityAtlanta
Period13/10/1917/10/19

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