Sensitivity of Pt/ZnO schottky diode characteristics to hydrogen

Suku Kim, B. S. Kang, F. Ren, K. Ip, Y. W. Heo, D. P. Norton, S. J. Pearton

Research output: Contribution to conferencePaperpeer-review

Abstract

Pt/ ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H 2 is introduced into a N 2 ambient at 25°C. The rectifying current-voltage(I-V) characteristic shows a non-reversible collapse to Ohmic behavior when as little as 50 ppm of H 2 is present in the N 2 ambient. At higher temperatures, the recovery is thermally activated with an activation energy of ∼0.25 eV. This suggests that introduction of hydrogen shallow donors into the ZnO is a contributor to the change in current of the diodes.

Original languageEnglish
Pages152-160
Number of pages9
StatePublished - 2004
EventState-of-the-Art Program on Compound Semiconductors XL (SOTAPOCS XL) and Narrow Bandgap Optoelectronic Materials and Devices II - Proceedings of the International Symposium - San Antonio, TX, United States
Duration: 9 May 200414 May 2004

Conference

ConferenceState-of-the-Art Program on Compound Semiconductors XL (SOTAPOCS XL) and Narrow Bandgap Optoelectronic Materials and Devices II - Proceedings of the International Symposium
Country/TerritoryUnited States
CitySan Antonio, TX
Period9/05/0414/05/04

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