Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

J. H. Shin; J. H. Kim; Y. G. Ju; H. E. Shin; Y. H. Lee

Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

J. H. Shin, J. H. Kim, Y. G. Ju, H. E. Shin, Y. H. Lee

Department of Physics Education

Korea Advanced Institute of Science and Technology

Research output: Contribution to journal › Conference article › peer-review

Abstract

A new method to estimate the spontaneous emission factor β is proposed and applied to 780 nm oxidized vertical-cavity surface-emitting lasers (VCSELs). An input-output equation for the fundamental mode at below threshold is obtained from the static photon and carrier rate equations. Based on the equation, if the mirror loss is known, the β can be experimentally determined by measuring the cavity loss and P versus I. A scanning Fabry-Perot interferometer can be used for measuring the below-threshold cavity loss at different current levels.

Original language	English
Pages (from-to)	273
Number of pages	1
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	11
State	Published - 1997
Event	Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, USA Duration: 18 May 1997 → 23 May 1997

Cite this

@article{c3cb95b05cb843ca8bfa337bc0ba73f1,

title = "Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss",

abstract = "A new method to estimate the spontaneous emission factor β is proposed and applied to 780 nm oxidized vertical-cavity surface-emitting lasers (VCSELs). An input-output equation for the fundamental mode at below threshold is obtained from the static photon and carrier rate equations. Based on the equation, if the mirror loss is known, the β can be experimentally determined by measuring the cavity loss and P versus I. A scanning Fabry-Perot interferometer can be used for measuring the below-threshold cavity loss at different current levels.",

author = "Shin, {J. H.} and Kim, {J. H.} and Ju, {Y. G.} and Shin, {H. E.} and Lee, {Y. H.}",

year = "1997",

language = "English",

volume = "11",

pages = "273",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO ; Conference date: 18-05-1997 Through 23-05-1997",

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TY - JOUR

T1 - Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

AU - Shin, J. H.

AU - Kim, J. H.

AU - Ju, Y. G.

AU - Shin, H. E.

AU - Lee, Y. H.

PY - 1997

Y1 - 1997

N2 - A new method to estimate the spontaneous emission factor β is proposed and applied to 780 nm oxidized vertical-cavity surface-emitting lasers (VCSELs). An input-output equation for the fundamental mode at below threshold is obtained from the static photon and carrier rate equations. Based on the equation, if the mirror loss is known, the β can be experimentally determined by measuring the cavity loss and P versus I. A scanning Fabry-Perot interferometer can be used for measuring the below-threshold cavity loss at different current levels.

AB - A new method to estimate the spontaneous emission factor β is proposed and applied to 780 nm oxidized vertical-cavity surface-emitting lasers (VCSELs). An input-output equation for the fundamental mode at below threshold is obtained from the static photon and carrier rate equations. Based on the equation, if the mirror loss is known, the β can be experimentally determined by measuring the cavity loss and P versus I. A scanning Fabry-Perot interferometer can be used for measuring the below-threshold cavity loss at different current levels.

UR - http://www.scopus.com/inward/record.url?scp=0030646798&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0030646798

SN - 1092-8081

VL - 11

SP - 273

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

T2 - Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO

Y2 - 18 May 1997 through 23 May 1997

ER -

Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

Abstract

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