Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

J. H. Shin; Y. G. Ju; H. E. Shin; Y. H. Lee

doi:10.1063/1.118869

Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

J. H. Shin, Y. G. Ju, H. E. Shin, Y. H. Lee

Department of Physics Education

Korea Advanced Institute of Science and Technology

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

A method to estimate the spontaneous emission factor β is proposed and applied to the 780 nm oxidized vertical-cavity surface-emitting lasers. The proportionality of the measured cavity loss multiplied by optical power to injected current is used. Our results agree better with theoretical calculations than those of conventional light-current curve fitting. The spontaneous emission factor 1: of 0.0021 is obtained for a 2-μm-square device at room temperature. Since only the below-threshold information of cavity loss and output power are used in our method, the obtained β values are independent of any complex and unexpected above-threshold effects such as thermally induced mode-size contraction, as they should be.

Original language	English
Pages (from-to)	2344-2346
Number of pages	3
Journal	Applied Physics Letters
Volume	70
Issue number	18
DOIs	https://doi.org/10.1063/1.118869
State	Published - 5 May 1997

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title = "Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss",

abstract = "A method to estimate the spontaneous emission factor β is proposed and applied to the 780 nm oxidized vertical-cavity surface-emitting lasers. The proportionality of the measured cavity loss multiplied by optical power to injected current is used. Our results agree better with theoretical calculations than those of conventional light-current curve fitting. The spontaneous emission factor 1: of 0.0021 is obtained for a 2-μm-square device at room temperature. Since only the below-threshold information of cavity loss and output power are used in our method, the obtained β values are independent of any complex and unexpected above-threshold effects such as thermally induced mode-size contraction, as they should be.",

author = "Shin, {J. H.} and Ju, {Y. G.} and Shin, {H. E.} and Lee, {Y. H.}",

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AU - Shin, J. H.

AU - Ju, Y. G.

AU - Shin, H. E.

AU - Lee, Y. H.

PY - 1997/5/5

Y1 - 1997/5/5

N2 - A method to estimate the spontaneous emission factor β is proposed and applied to the 780 nm oxidized vertical-cavity surface-emitting lasers. The proportionality of the measured cavity loss multiplied by optical power to injected current is used. Our results agree better with theoretical calculations than those of conventional light-current curve fitting. The spontaneous emission factor 1: of 0.0021 is obtained for a 2-μm-square device at room temperature. Since only the below-threshold information of cavity loss and output power are used in our method, the obtained β values are independent of any complex and unexpected above-threshold effects such as thermally induced mode-size contraction, as they should be.

AB - A method to estimate the spontaneous emission factor β is proposed and applied to the 780 nm oxidized vertical-cavity surface-emitting lasers. The proportionality of the measured cavity loss multiplied by optical power to injected current is used. Our results agree better with theoretical calculations than those of conventional light-current curve fitting. The spontaneous emission factor 1: of 0.0021 is obtained for a 2-μm-square device at room temperature. Since only the below-threshold information of cavity loss and output power are used in our method, the obtained β values are independent of any complex and unexpected above-threshold effects such as thermally induced mode-size contraction, as they should be.

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss

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