Abstract
A new method to estimate the spontaneous emission factor β is proposed and applied to 780 nm oxidized vertical-cavity surface-emitting lasers (VCSELs). An input-output equation for the fundamental mode at below threshold is obtained from the static photon and carrier rate equations. Based on the equation, if the mirror loss is known, the β can be experimentally determined by measuring the cavity loss and P versus I. A scanning Fabry-Perot interferometer can be used for measuring the below-threshold cavity loss at different current levels.
| Original language | English |
|---|---|
| Pages (from-to) | 273 |
| Number of pages | 1 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 11 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, USA Duration: 18 May 1997 → 23 May 1997 |