Abstract
GaN-based microscale light-emitting diodes (μLEDs) are reported for assembly into deformable displays and repair systems. A stamp-imprinting method that enables large area assembly without spatial limitation is involved in the system, and a selective pick-up method is presented that includes a method for removing detected defective chips through micro-pulsed laser scanning. The photosensitive functional material, which is an accepted layer for the stable imprinting of chips, is determined by controlling the adhesion. In addition, selective pick-up and adhesion-controlled functional materials allow the implementation of defect-free displays through two pick-and-place cycles. Displays and related systems fabricated with this method can offer interesting optical and electrical properties.
Original language | English |
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Article number | 11551 |
Journal | Scientific Reports |
Volume | 9 |
Issue number | 1 |
DOIs | |
State | Published - 1 Dec 2019 |