Steep Slope Field-Effect Transistors with Ag/TiO2-Based Threshold Switching Device

Jeonghwan Song, Jiyong Woo, Sangheon Lee, Amit Prakash, Jongmyung Yoo, Kibong Moon, Hyunsang Hwang

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

In this letter, we demonstrate a steep slope field-effect transistor (FET) using a threshold switching (TS) device. The Ag/TiO2-based TS device reported in our previous work was implemented in series with the drain region of a transistor. Since the TS device has an abrupt transition between the OFF- and ON-states and vice versa, the transistor has a 5-mV/decade subthreshold slope and a high ON/OFF-current ratio (IONIOFF) of > 107 with a low drain voltage (0.3 V). Furthermore, the threshold voltage (Vth, FET}}) of the transistor can be tuned by controlling the thickness of the TS device.

Original languageEnglish
Article number7468532
Pages (from-to)932-934
Number of pages3
JournalIEEE Electron Device Letters
Volume37
Issue number7
DOIs
StatePublished - Jul 2016

Keywords

  • field-effect transistor
  • steep slope
  • subthreshold slope
  • Threshold switching

Fingerprint

Dive into the research topics of 'Steep Slope Field-Effect Transistors with Ag/TiO2-Based Threshold Switching Device'. Together they form a unique fingerprint.

Cite this