Skip to main navigation Skip to search Skip to main content

Structurally engineered stackable and scalable 3D titanium-oxide switching devices for high-density nanoscale memory

  • Daeseok Lee
  • , Jaesung Park
  • , Jaehyuk Park
  • , Jiyong Woo
  • , Euijun Cha
  • , Sangheon Lee
  • , Kibong Moon
  • , Jeonghwan Song
  • , Yunmo Koo
  • , Hyunsang Hwang
  • Pohang University of Science and Technology

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

(Graph Presented). A 3D highdensity switching device is realized utilizing titanium oxide, which is the most optimum material, but which is not practically demonstrated yet. The 1S1R (one ReRAM with the developed switching device) exhibits memory characteristics with a significantly suppressed sneak current, which can be used to realize highdensity ReRAM applications.

Original languageEnglish
Pages (from-to)59-64
Number of pages6
JournalAdvanced Materials
Volume27
Issue number1
DOIs
StatePublished - 6 Nov 2015

Keywords

  • 3D structure
  • Cross-point array
  • Metal-insulator transition
  • Non-volatilememory
  • Titanium oxide
  • Two-terminal switch

Fingerprint

Dive into the research topics of 'Structurally engineered stackable and scalable 3D titanium-oxide switching devices for high-density nanoscale memory'. Together they form a unique fingerprint.

Cite this