TY - GEN
T1 - Study of radiation effects on cream electronics
AU - Amare, Y.
AU - Derome, L.
AU - Ebongue, C.
AU - Gupta, M.
AU - Haque, A.
AU - Kim, H. J.
AU - Kwashnak, K.
AU - Lee, M. H.
AU - Lutz, L.
AU - Malinin, A.
AU - Page, A.
AU - Seo, E. S.
AU - Zuckerman, D.
N1 - Publisher Copyright:
© 2013 Sociedade Brasileira de Fisica. All Rights Reserved.
PY - 2013
Y1 - 2013
N2 - The Cosmic Ray Energetics and Mass (CREAM) instrument is currently being reconfigured for the International Space Station (ISS). The space radiation environment originating from several sources, such as galactic cosmic rays, energetic solar particles from the Sun, and trapped particles in the radiation belts, create special design challenges. Environments with high levels of ionizing radiation can cause Single Event Effects (SEEs), such as bit flips, current spikes, and other malfunctions in electronic components. SEEs in electronic components have been studied using heavy ion beams, 15 MeV/amu He, Ne, Ar, Cu, Xe, and Au nuclei, in the range of Linear Energy Transfer (LET) from 0.121 to 85.4 MeV-cm2/mg. Single Event Latchup (SEL) and Single Event Transient (SET) rates were measured. Results from radiation tests performed at the Texas A&M University cyclotron beam facility and projections to the electronics’ performance aboard the ISS are presented.
AB - The Cosmic Ray Energetics and Mass (CREAM) instrument is currently being reconfigured for the International Space Station (ISS). The space radiation environment originating from several sources, such as galactic cosmic rays, energetic solar particles from the Sun, and trapped particles in the radiation belts, create special design challenges. Environments with high levels of ionizing radiation can cause Single Event Effects (SEEs), such as bit flips, current spikes, and other malfunctions in electronic components. SEEs in electronic components have been studied using heavy ion beams, 15 MeV/amu He, Ne, Ar, Cu, Xe, and Au nuclei, in the range of Linear Energy Transfer (LET) from 0.121 to 85.4 MeV-cm2/mg. Single Event Latchup (SEL) and Single Event Transient (SET) rates were measured. Results from radiation tests performed at the Texas A&M University cyclotron beam facility and projections to the electronics’ performance aboard the ISS are presented.
KW - CREAM
KW - ISS
KW - Single event effect
UR - http://www.scopus.com/inward/record.url?scp=84898833012&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84898833012
T3 - Proceedings of the 33rd International Cosmic Rays Conference, ICRC 2013
BT - Proceedings of the 33rd International Cosmic Rays Conference, ICRC 2013
PB - Sociedade Brasileira de Fisica
T2 - 33rd International Cosmic Rays Conference, ICRC 2013
Y2 - 2 July 2013 through 9 July 2013
ER -