Study on address discharge characteristics using Vt close-curve analysis in ac PDPs

Byung Gwon Cho, Heung Sik Tae

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The address discharge characteristics by the various scan-low and common-bias voltages are investigated based on measured address discharge time lags and Vt close-curve analysis. The scan-low voltages are changed with the same voltage difference between the X and Y electrodes during an address period, meaning that the voltage difference between the scan-low voltage applied to the Y electrode and the common-bias voltage applied to the X electrode remains constant even though each voltage level changes. As the voltage difference between the scan and address electrodes is increased during an address period, the address discharge time lag is shortened but a high background luminance is induced. It is found that the improved address discharge characteristics is caused by the effect of the higher external applied voltage during an address period than the accumulated wall charges during a reset period and the high background luminance can be prevented by applying an address-bias voltage during a rising-ramp period.

Original languageEnglish
Pages (from-to)1625-1628
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume38
Issue number1
DOIs
StatePublished - 2007
Event2007 SID International Symposium - Long Beach, CA, United States
Duration: 23 May 200725 May 2007

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