TY - GEN
T1 - TailCut
T2 - 59th ACM/IEEE Design Automation Conference, DAC 2022
AU - Lee, Jaeyong
AU - Kim, Myungsunk
AU - Choi, Wonil
AU - Lee, Sanggu
AU - Kim, Jihong
N1 - Publisher Copyright:
© 2022 ACM.
PY - 2022/7/10
Y1 - 2022/7/10
N2 - Although lateral charge spreading is considered as a dominant error source in 3D NAND flash memory, little is known about its detailed characteristics at the storage system level. From a device characterization study, we observed that lateral charge spreading strongly depends on vertically adjacent state patterns and a few specific patterns are responsible for a large portion of bit errors from lateral charge spreading. We propose a new state encoding scheme, called TailCut, which removes vulnerable state patterns by modifying encoded states. By removing vulnerable patterns, TailCut can improve the SSD lifetime and read latency by 80% and 25%, respectively.
AB - Although lateral charge spreading is considered as a dominant error source in 3D NAND flash memory, little is known about its detailed characteristics at the storage system level. From a device characterization study, we observed that lateral charge spreading strongly depends on vertically adjacent state patterns and a few specific patterns are responsible for a large portion of bit errors from lateral charge spreading. We propose a new state encoding scheme, called TailCut, which removes vulnerable state patterns by modifying encoded states. By removing vulnerable patterns, TailCut can improve the SSD lifetime and read latency by 80% and 25%, respectively.
UR - http://www.scopus.com/inward/record.url?scp=85137514938&partnerID=8YFLogxK
U2 - 10.1145/3489517.3530471
DO - 10.1145/3489517.3530471
M3 - Conference contribution
AN - SCOPUS:85137514938
T3 - Proceedings - Design Automation Conference
SP - 409
EP - 414
BT - Proceedings of the 59th ACM/IEEE Design Automation Conference, DAC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 10 July 2022 through 14 July 2022
ER -