TCAM-PUF with improved reliability and uniqueness for security improvement

T. Nagakarthik, Jeong O. Kim, Tae Yang Kim, Joon Ho Kong, Jun Rim Choi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This manuscript addresses a novel ternary content addressable memory (TCAM) based physical unclonable function (PUF) with improved reliability and uniqueness for security improvement. In order to use TCAM as a PUF in an application, the stability of its startup patterns needs to be assured under wide variety of conditions such as temperature and applied voltage. Furthermore, the startup patterns of different memories must be unique and contain sufficient entropy. This paper presents the simulation results of startup pattern of TCAM PUF and reliability test in various temperature and voltage conditions.

Original languageEnglish
Title of host publication2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages633-634
Number of pages2
ISBN (Electronic)9781509015702
DOIs
StatePublished - 3 Jan 2017
Event2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 - Jeju, Korea, Republic of
Duration: 25 Oct 201628 Oct 2016

Publication series

Name2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016

Conference

Conference2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016
Country/TerritoryKorea, Republic of
CityJeju
Period25/10/1628/10/16

Keywords

  • puf
  • realibility
  • security
  • tcampuf
  • uniqueness

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