Terahertz dielectric response of ferroelectric BaxSr 1-xTiO3 thin films

Seung Beom Kang; Min Hwan Kwak; Muhan Choi; Sungil Kim; Taeyong Kim; Eun Jong Cha; Kwang Yong Kang

doi:10.1109/TUFFC.2011.2084

Terahertz dielectric response of ferroelectric Ba_xSr _1-xTiO₃ thin films

Seung Beom Kang, Min Hwan Kwak, Muhan Choi, Sungil Kim, Taeyong Kim, Eun Jong Cha, Kwang Yong Kang

School of Electronics Engineering

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric Ba_xSr _1-xTiO₃ thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba _xSr_1-xTiO₃ thin films varies with the films compositions. Among the compositions of Ba_xSr_1-xTiO ₃ films with different Ba/Sr ratios, Ba_0.6Sr _0.4TiO₃ has the highest dielectric constants and the shortest dielectric relaxation time.

Original language	English
Article number	6071045
Pages (from-to)	2276-2280
Number of pages	5
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	58
Issue number	11
DOIs	https://doi.org/10.1109/TUFFC.2011.2084
State	Published - Nov 2011

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@article{eee0c87e75464332b740f524355f6902,

title = "Terahertz dielectric response of ferroelectric BaxSr 1-xTiO3 thin films",

abstract = "Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric BaxSr 1-xTiO3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba xSr1-xTiO3 thin films varies with the films compositions. Among the compositions of BaxSr1-xTiO 3 films with different Ba/Sr ratios, Ba0.6Sr 0.4TiO3 has the highest dielectric constants and the shortest dielectric relaxation time.",

author = "Kang, \{Seung Beom\} and Kwak, \{Min Hwan\} and Muhan Choi and Sungil Kim and Taeyong Kim and Cha, \{Eun Jong\} and Kang, \{Kwang Yong\}",

year = "2011",

month = nov,

doi = "10.1109/TUFFC.2011.2084",

language = "English",

volume = "58",

pages = "2276--2280",

journal = "IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control",

issn = "0885-3010",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "11",

}

TY - JOUR

T1 - Terahertz dielectric response of ferroelectric BaxSr 1-xTiO3 thin films

AU - Kang, Seung Beom

AU - Kwak, Min Hwan

AU - Choi, Muhan

AU - Kim, Sungil

AU - Kim, Taeyong

AU - Cha, Eun Jong

AU - Kang, Kwang Yong

PY - 2011/11

Y1 - 2011/11

N2 - Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric BaxSr 1-xTiO3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba xSr1-xTiO3 thin films varies with the films compositions. Among the compositions of BaxSr1-xTiO 3 films with different Ba/Sr ratios, Ba0.6Sr 0.4TiO3 has the highest dielectric constants and the shortest dielectric relaxation time.

AB - Terahertz time-domain spectroscopy has been used to investigate the dielectric and optical properties of ferroelectric BaxSr 1-xTiO3 thin films for nominal x-values of 0.4, 0.6, and 0.8 in the frequency range of 0.3 to 2.5 THz. The ferroelectric thin films were deposited at approximately 700 nm thickness on [001] MgO substrate by pulsed laser deposition. The measured complex dielectric and optical constants were compared with the Cole-Cole relaxation model. The results show that the Cole-Cole relaxation model fits well with the data throughout the frequency range and the dielectric relaxation behavior of ferroelectric Ba xSr1-xTiO3 thin films varies with the films compositions. Among the compositions of BaxSr1-xTiO 3 films with different Ba/Sr ratios, Ba0.6Sr 0.4TiO3 has the highest dielectric constants and the shortest dielectric relaxation time.

UR - https://www.scopus.com/pages/publications/81355161214

U2 - 10.1109/TUFFC.2011.2084

DO - 10.1109/TUFFC.2011.2084

M3 - Article

C2 - 22083760

AN - SCOPUS:81355161214

SN - 0885-3010

VL - 58

SP - 2276

EP - 2280

JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

IS - 11

M1 - 6071045

ER -

Terahertz dielectric response of ferroelectric Ba_xSr _1-xTiO₃ thin films

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