TY - GEN
T1 - TEST
T2 - International Conference on Advanced Software Engineering and Its Applications, ASEA 2009, Held as Part of the Future Generation Information Technology Conference, FGIT 2009
AU - Chae, Hochang
AU - Jin, Xiulin
AU - Lee, Seonghun
AU - Cho, Jeonghun
PY - 2009
Y1 - 2009
N2 - The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster. In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation (SILS). A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system.
AB - The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster. In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation (SILS). A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system.
KW - embedded system software
KW - testing environment
KW - TTCN-3 testing system
UR - https://www.scopus.com/pages/publications/78049362104
U2 - 10.1007/978-3-642-10619-4_25
DO - 10.1007/978-3-642-10619-4_25
M3 - Conference contribution
AN - SCOPUS:78049362104
SN - 3642106188
SN - 9783642106187
T3 - Communications in Computer and Information Science
SP - 204
EP - 212
BT - Advances in Software Engineering - Intl. Conf. on Advanced Software Engineering and Its Applications, ASEA 2009, Part of Future Generation Information Technology Conf., FGIT 2009, Proc.
Y2 - 10 December 2009 through 12 December 2009
ER -