Thermal annealing effect on the crack development and the stability of 6,13-bis(triisopropylsilylethynyl)-pentacene field-effect transistors with a solution-processed polymer insulator

Jin Hyuk Bae, Jaehoon Park, Chang Min Keum, Won Ho Kim, Min Hoi Kim, Seul Ong Kim, Soon Ki Kwon, Sin Doo Lee

Research output: Contribution to journal › Article › peer-review

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