Abstract
New thallium based intrinsically activated scintillator for X-ray and gamma ray detection is reported. Luminescence and scintillation properties are measured under X-ray and γ-ray excitation sources at room temperature. This compound is grown from the melt using two zones vertical Bridgman method. X-ray induced emission spectrum exhibits intense luminescence band at 441 nm wavelength. Scintillation light yield and energy resolution are found to be 37,600 ± 3700 ph/MeV and 4.6% (FWHM), respectively under 662 keV excitation from 137Cs source. Two decay time constants are obtained when sample is excited by γ-ray at room temperature. Measured properties revealed that this compound is a potential scintillator and could be used as radiation detector in different applications.
| Original language | English |
|---|---|
| Pages (from-to) | 523-526 |
| Number of pages | 4 |
| Journal | Optical Materials |
| Volume | 73 |
| DOIs | |
| State | Published - Nov 2017 |
Keywords
- A1. Decay time
- A1. Energy resolution
- A1. Scintillator
- A1. X-ray
- B2. Light yield
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