Abstract
This work employs novel SnO2 gel-like precursors in conjunction with sol-gel deposited ZrO2 gate dielectrics to realize high-performance transparent transistors. Representative devices show excellent performance and transparency, and deliver mobility of 103 cm2 V -1 s-1 in saturation at operation voltages as low as 2 V, a sub-threshold swing of only 0.3 V/decade, and Ion/Ioff of 104∼105.
| Original language | English |
|---|---|
| Pages (from-to) | 1042-1047 |
| Number of pages | 6 |
| Journal | Advanced Materials |
| Volume | 25 |
| Issue number | 7 |
| DOIs | |
| State | Published - 20 Feb 2013 |
Keywords
- metal oxides
- sol-gel process
- solution process
- thin film transistors
- transparent