Tunable fabry-perot interferometer designed for far-infrared wavelength by utilizing electromagnetic force

Dong Geon Jung, Jun Yeop Lee, Jae Keon Kim, Daewoong Jung, Seong Ho Kong

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A tunable Fabry-Perot interferometer (TFPI)-type wavelength filter designed for the long-wavelength infrared (LWIR) region is fabricated using micro electro mechanical systems (MEMS) technology and the novel polydimethylsiloxane (PDMS) micro patterning technique. The structure of the proposed infrared sensor consists of a Fabry-Perot interferometer (FPI)-based optical filter and infrared (IR) detector. An amorphous Si-based thermal IR detector is located under the FPI-based optical filter to detect the IR-rays filtered by the FPI. The filtered IR wavelength is selected according to the air etalon gap between reflectors, which is defined by the thickness of the patterned PDMS. The 8 µm-thick PDMS pattern is fabricated on a 3 nm-thick Al layer used as a reflector. The air etalon gap is changed using the electromagnetic force between the permanent magnet and solenoid. The measured PDMS gap height is about 2 µm, ranging from 8 µm to 6 µm, with driving current varying from 0 mA to 600 mA, resulting in a tunable wavelength range of 4 µm. The 3-dB bandwidth (full width at half maximum, FWHM) of the proposed filter is 1.5 nm, while the Free Spectral Range (FSR) is 8 µm. Experimental results show that the proposed TFPI can detect a specific wavelength at the long LWIR region.

Original languageEnglish
Article number2572
JournalSensors
Volume18
Issue number8
DOIs
StatePublished - 6 Aug 2018

Keywords

  • FPI
  • IR detector
  • Optical filter

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