Unsupervised Deep Learning-based End-to-end Network for Anomaly Detection and Localization

Bekhzod Olimov, Barathi Subramanian, Jeonghong Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

These days there is great demand for automatizing a visual inspection process in industrial companies since it is a tedious and time-consuming task. Recent progress in deep convolutional neural networks allowed to automatize visual inspection procedure. However, currently available supervised learning methods require large amount of labeled data, while the unsupervised learning techniques suffer from lack of accuracy. To address these problems, we propose a deep learning-based unsupervised learning method that exhibits fast and precise performance. The proposed unsupervised learning method based pseudo-labeling algorithm using graph Laplacian matrix that allows transferring computationally expensive autoencoder problem to classification task, the proposed system benefits from very fast convergence ability and significantly outperforms currently available deep learning-based AVI methods. In the conducted experiments using real-life fabric image datasets, the proposed method outperformed the currently available methods in terms of speed and accuracy.

Original languageEnglish
Title of host publicationICUFN 2022 - 13th International Conference on Ubiquitous and Future Networks
PublisherIEEE Computer Society
Pages444-449
Number of pages6
ISBN (Electronic)9781665485500
DOIs
StatePublished - 2022
Event13th International Conference on Ubiquitous and Future Networks, ICUFN 2022 - Virtual, Barcelona, Spain
Duration: 5 Jul 20228 Jul 2022

Publication series

NameInternational Conference on Ubiquitous and Future Networks, ICUFN
Volume2022-July
ISSN (Print)2165-8528
ISSN (Electronic)2165-8536

Conference

Conference13th International Conference on Ubiquitous and Future Networks, ICUFN 2022
Country/TerritorySpain
CityVirtual, Barcelona
Period5/07/228/07/22

Keywords

  • Deep convolutional neural networks
  • fabric defect detection
  • industrial quality inspection
  • unsupervised learning

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