@inproceedings{d73cb27bb1c4451d9620853075dc62ab,
title = "Wafer Pattern Recognition for Detecting Process Abnormalities in NAND Flash Memory Manufacturing",
abstract = "We have adopted various defect detection systems in the front stage of manufacturing in order to effectively manage the quality of flash memory products. In this paper, we propose an intelligent pattern recognition methodology which enables us to discriminate abnormal wafer automatically in the course of NAND flash memory manufacturing. Our proposed technique consists of the two steps: pre-processing and hybrid clustering. The pre-processing step based on process primitives efficiently eliminates noisy data. Then, the hybrid clustering step dramatically reduces the total amount of computing, which makes our technique practical for the mass production of NAND flash memory.",
author = "Jeongin Choe and Taehyeon Kim and Saetbyeol Yoon and Sangyong Yoon and Song, {Ki Whan} and Song, {Jai Hyuk} and Myungsuk Kim and Choi, {Woo Young}",
note = "Publisher Copyright: Copyright {\textcopyright} 2021 ASM International{\textregistered} All rights reserved.; 47th International Symposium for Testing and Failure Analysis Conference, ISTFA 2021 ; Conference date: 31-10-2021 Through 04-11-2021",
year = "2021",
doi = "10.31399/asm.cp.istfa2021p0406",
language = "English",
series = "Conference Proceedings from the International Symposium for Testing and Failure Analysis",
publisher = "ASM International",
pages = "406--409",
booktitle = "ISTFA 2021",
address = "United States",
}