You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems

Kui Liu, Anil Koyuncu, Tegawende F. Bissyande, Dongsun Kim, Jacques Klein, Yves Le Traon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

119 Scopus citations

Abstract

Properly benchmarking Automated Program Repair (APR) systems should contribute to the development and adoption of the research outputs by practitioners. To that end, the research community must ensure that it reaches significant milestones by reliably comparing state-of-the-art tools for a better understanding of their strengths and weaknesses. In this work, we identify and investigate a practical bias caused by the fault localization (FL) step in a repair pipeline. We propose to highlight the different fault localization configurations used in the literature, and their impact on APR systems when applied to the Defects4J benchmark. Then, we explore the performance variations that can be achieved by 'tweaking' the FL step. Eventually, we expect to create a new momentum for (1) full disclosure of APR experimental procedures with respect to FL, (2) realistic expectations of repairing bugs in Defects4J, as well as (3) reliable performance comparison among the state-of-theart APR systems, and against the baseline performance results of our thoroughly assessed kPAR repair tool. Our main findings include: (a) only a subset of Defects4J bugs can be currently localized by commonly-used FL techniques; (b) current practice of comparing state-of-the-art APR systems (i.e., counting the number of fixed bugs) is potentially misleading due to the bias of FL configurations; and (c) APR authors do not properly qualify their performance achievement with respect to the different tuning parameters implemented in APR systems.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages102-113
Number of pages12
ISBN (Electronic)9781728117355
DOIs
StatePublished - Apr 2019
Event12th IEEE International Conference on Software Testing, Verification and Validation, ICST 2019 - Xi'an, China
Duration: 22 Apr 201927 Apr 2019

Publication series

NameProceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019

Conference

Conference12th IEEE International Conference on Software Testing, Verification and Validation, ICST 2019
Country/TerritoryChina
CityXi'an
Period22/04/1927/04/19

Keywords

  • Automated Program Repair
  • Benchmarking
  • Bias
  • Empirical Assessment
  • Spectrum-based Fault Localization

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